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https://hdl.handle.net/11499/10733
Title: | Investigation of electrical and structural properties of in-doped CdTe/CdS thin-film solar cells produced by E-beam techniques | Authors: | Kirbas, I. Karabacak, Rasim Yilmaz, K. Takanoglu, D. |
Keywords: | E-beam Electrical properties In-doped CdTe Structural properties Thin-film solar cells |
Publisher: | National Institute of Optoelectronics | Abstract: | In the current study, the electron beam (e-beam) evaporation deposition technique was utilized to examine the effect of annealing on the structural and electrical properties of In-doped CdTe/CdS thin-film solar cells. Thin-film solar cells were deposited onto the ITO-coated glass substrate with the e-beam technique. These solar cells were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray (EDS) analysis. The crystallite size, inter-planer distance, and lattice constant values were calculated for the thin-film solar cells using XRD data. The current– voltage (I–V) characteristics of the solar cells were examined by solar simulator. © 2018, National Institute of Optoelectronics. All rights reserved. | URI: | https://hdl.handle.net/11499/10733 | ISSN: | 1842-6573 |
Appears in Collections: | Fen-Edebiyat Fakültesi Koleksiyonu Mühendislik Fakültesi Koleksiyonu Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection |
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