Please use this identifier to cite or link to this item: https://hdl.handle.net/11499/10733
Title: Investigation of electrical and structural properties of in-doped CdTe/CdS thin-film solar cells produced by E-beam techniques
Authors: Kirbas, I.
Karabacak, Rasim
Yilmaz, K.
Takanoglu, D.
Keywords: E-beam
Electrical properties
In-doped CdTe
Structural properties
Thin-film solar cells
Publisher: National Institute of Optoelectronics
Abstract: In the current study, the electron beam (e-beam) evaporation deposition technique was utilized to examine the effect of annealing on the structural and electrical properties of In-doped CdTe/CdS thin-film solar cells. Thin-film solar cells were deposited onto the ITO-coated glass substrate with the e-beam technique. These solar cells were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray (EDS) analysis. The crystallite size, inter-planer distance, and lattice constant values were calculated for the thin-film solar cells using XRD data. The current– voltage (I–V) characteristics of the solar cells were examined by solar simulator. © 2018, National Institute of Optoelectronics. All rights reserved.
URI: https://hdl.handle.net/11499/10733
ISSN: 1842-6573
Appears in Collections:Fen-Edebiyat Fakültesi Koleksiyonu
Mühendislik Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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