Please use this identifier to cite or link to this item: https://hdl.handle.net/11499/8901
Title: Investigation of the structural properties of annealed CdIn2Te4/CdS thin film solar cells produced by the electron-beam evaporation (e-beam) technique
Authors: Kırbaş, İ.
Karabacak, Rasim
Keywords: electron beam evaporation
semiconductors
structural properties
thin films
X-ray diffraction (XRD)
Annealing
Cadmium sulfide
Crystallite size
Electron beams
Electrons
Evaporation
ITO glass
Physical vapor deposition
Scanning electron microscopy
Semiconductor materials
Solar cells
Structural properties
Substrates
Surface roughness
Thin films
X ray diffraction
Annealed samples
Coated glass substrates
Diffraction peaks
Effect of annealing
Electron beam evaporation
Energy dispersive x-ray
Nitrogen atmospheres
Thin films solar cells
Thin film solar cells
Publisher: Maik Nauka-Interperiodica Publishing
Abstract: Thin film CdIn2Te4/CdS solar cells were deposited onto the ITO-coated glass substrate by electron beam evaporation (e-beam) technique, and the the effect of annealing on their structural properties is studied. The annealing was performed under nitrogen atmosphere for 1 h. The manufactured solar cells were studied by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy dispersive X-ray (EDAX) analysis. Crystallite size (D), inter-planer distance (d) and lattice constant (a) values were calculated for the thin film solar cell from XRD data. Annealed samples display well defined XRD patterns with three diffraction peaks. We observed increased peak intensity in the annealed films. EDAX analysis showed that only CdIn2Te4 is present in absorber layer and CdS is found in the window layer, but no impurity atoms are present the structure. It is observed that surface roughness of the annealed films incresed, according to SEM images. The I–V characteristics show that the current is increased for annealed thin films solar cells. © 2017, Pleiades Publishing, Ltd.
URI: https://hdl.handle.net/11499/8901
https://doi.org/10.1134/S0036024417100168
ISSN: 0036-0244
Appears in Collections:Mühendislik Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection

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