Please use this identifier to cite or link to this item: https://hdl.handle.net/11499/9409
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dc.contributor.authorKırbaş, İbrahim-
dc.contributor.authorKarabacak, Rasim-
dc.date.accessioned2019-08-16T13:01:05Z
dc.date.available2019-08-16T13:01:05Z
dc.date.issued2016-
dc.identifier.issn0030-4026-
dc.identifier.urihttps://hdl.handle.net/11499/9409-
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2016.06.014-
dc.description.abstractIn this study, a thermal evaporation technique and the effect of annealing on the structural properties of CdIn2Te4/CdS thin film solar cells were investigated. Thin film solar cells were deposited onto an indium tin oxide (ITO)-coated glass substrate using a thermal evaporation technique. The nitrogen atmosphere was 400 °C for 1 h of annealing. X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy dispersive X-ray (EDAX) analysis were performed on the solar cells. XRD analysis revealed two peaks (2? = 27.2° and 33.6°). We observed increased peak severity but identical peak position in the annealed films. The X-ray diffraction patterns of the annealed and as-deposited solar cells’ preferred orientations in nature have been detected as (200) and (202), respectively. Crystallite size (D), inter-planar distance (d), and lattice constant (a) values were calculated for the thin film solar cells using the XRD data. When examining the EDAX analysis and element placement, we detected only CdIn2Te4 in the absorber layer and only CdS atoms in the window layer, but no impurity atoms in the structure. We also observed an increase in surface roughness of the annealed films in SEM images. The I–V characteristics show that the current is increased for annealed thin films solar cells. © 2016 Elsevier GmbHen_US
dc.language.isoenen_US
dc.publisherElsevier GmbHen_US
dc.relation.ispartofOptiken_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdIn2Te4en_US
dc.subjectII–VI Semiconductorsen_US
dc.subjectThermal evaporationen_US
dc.subjectThin films solar cellsen_US
dc.subjectAnnealingen_US
dc.subjectCadmium sulfideen_US
dc.subjectCrystallite sizeen_US
dc.subjectEvaporationen_US
dc.subjectIndiumen_US
dc.subjectITO glassen_US
dc.subjectScanning electron microscopyen_US
dc.subjectSolar cellsen_US
dc.subjectStructural propertiesen_US
dc.subjectSubstratesen_US
dc.subjectSurface roughnessen_US
dc.subjectThin filmsen_US
dc.subjectTin oxidesen_US
dc.subjectX ray diffractionen_US
dc.subjectCdIn<sub>2</sub>Te<sub>4</sub>en_US
dc.subjectCoated glass substratesen_US
dc.subjectEffect of annealingen_US
dc.subjectEnergy dispersive x-rayen_US
dc.subjectNitrogen atmospheresen_US
dc.subjectPreferred orientationsen_US
dc.subjectThermal evaporation techniqueen_US
dc.subjectThin film solar cellsen_US
dc.titleEffect of annealing on the structural properties of thermal evaporated CdIn2Te4/CdS thin film solar cellsen_US
dc.typeArticleen_US
dc.identifier.volume127en_US
dc.identifier.issue19en_US
dc.identifier.startpage7986
dc.identifier.startpage7986en_US
dc.identifier.endpage7992en_US
dc.authorid0000-0002-5560-638X-
dc.identifier.doi10.1016/j.ijleo.2016.06.014-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopus2-s2.0-84990997288en_US
dc.identifier.wosWOS:000380417900072en_US
dc.identifier.scopusqualityQ3-
dc.ownerPamukkale University-
item.languageiso639-1en-
item.fulltextNo Fulltext-
item.openairetypeArticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.grantfulltextnone-
crisitem.author.dept10.07. Mechanical Engineering-
Appears in Collections:Mühendislik Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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