Please use this identifier to cite or link to this item: https://hdl.handle.net/11499/6105
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dc.contributor.authorKeserlioglu, Mehmet Serhat-
dc.contributor.authorErkaya, H.H.-
dc.date.accessioned2019-08-16T12:04:13Z-
dc.date.available2019-08-16T12:04:13Z-
dc.date.issued2011-
dc.identifier.issn1300-0632-
dc.identifier.urihttps://hdl.handle.net/11499/6105-
dc.identifier.urihttps://doi.org/10.3906/elk-0812-29-
dc.description.abstractIn this study, the reverse-recovery behaviors of pin and p+ n diodes were simulated as a function of the reverse current and carrier lifetime. For this purpose, a 1-D simulation program was written to solve the semiconductor equations. MatLab partial differential equation solver was used. The reverse recovery response of pin and p+ n diodes was obtained for various values of a resistor in series and of carrier lifetime. The transient response for voltage and current was determined. © TÜBI•TAK.en_US
dc.language.isoenen_US
dc.relation.ispartofTurkish Journal of Electrical Engineering and Computer Sciencesen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectPin diodeen_US
dc.subjectReverse recoveryen_US
dc.subjectSemiconductor devicesen_US
dc.subjectSemiconductor devices simulationen_US
dc.subject1-D simulationen_US
dc.subjectPartial differentialen_US
dc.subjectPiN diodeen_US
dc.subjectReverse biasen_US
dc.subjectReverse currentsen_US
dc.subjectSemiconductor equationsen_US
dc.subjectStorage timeen_US
dc.subjectTransient responseen_US
dc.subjectCarrier lifetimeen_US
dc.subjectDifferential equationsen_US
dc.subjectRecoveryen_US
dc.subjectSemiconductor device manufactureen_US
dc.subjectSemiconductor switchesen_US
dc.subjectSemiconductor diodesen_US
dc.titleSimulation of storage time versus reverse bias current for p+n and pin diodesen_US
dc.typeArticleen_US
dc.identifier.volume19en_US
dc.identifier.issue1en_US
dc.identifier.startpage87en_US
dc.identifier.endpage96en_US
dc.identifier.doi10.3906/elk-0812-29-
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.identifier.scopus2-s2.0-78650856554en_US
dc.identifier.trdizinid111427en_US
dc.identifier.wosWOS:000288230700007en_US
dc.identifier.scopusqualityQ3-
dc.ownerPamukkale University-
item.openairetypeArticle-
item.grantfulltextopen-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
item.languageiso639-1en-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
crisitem.author.dept10.04. Electrical-Electronics Engineering-
Appears in Collections:Mühendislik Fakültesi Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu / Scopus Indexed Publications Collection
TR Dizin İndeksli Yayınlar Koleksiyonu / TR Dizin Indexed Publications Collection
WoS İndeksli Yayınlar Koleksiyonu / WoS Indexed Publications Collection
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